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CALL FOR PARTICIPATION

Scope -- Registration -- Hotel Reservation -- Advance Program -- Additional Information --

Scope

The IEEE VLSI Test Symposium (VTS) explores emerging trends and novel concepts in testing, debug and repair of microelectronic circuits and systems through an exciting program that includes Keynote, Technical Paper Sessions, Panel, New Topic Sessions, Half-day and embedded Tutorials, Innovative Practices Tracks, PhD Student Contest.

In 2015 VTS will take place in Napa, California (USA) and will be sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).

Please make your Silverado Hotel and Resort room reservation at the VTS 2015 conference discounted rate NOW while space is still available! All VTS 2015 reservations must be made by March 27, 2015.

The technical program will include:

TECHNICAL PAPER SESSIONS that will present the latest research results in test, including:

2.5D, 3D and SiP Test
Analog, Mixed-Signal & RF Test
ATE Architecture & Software
ATPG & Compression
Built-In Self-Test (BIST)
Defect & Current Based Test
Defect and Fault Modeling, Defect based Fault Analysis
Delay & Performance Test
Dependability and Reliability
Design For Testability
Design Verification/Validation
Diagnosis and Debug
Embedded System & Board Test
Embedded Test Methods
Emerging Technologies Test
FPGA Test
Hardware Security
High Level System Testing
Memory Test and Repair
On-Line Test & Error Correction
Power and Thermal Issues in Test
System-on-Chip (SOC) Test
Test Economics/Test Quality
Test of Biomedical Devices
Test of High-Speed I/O
Test of MEMS
Test Resource Partitioning
Test Standards
Transients and Soft Errors

INNOVATIVE PRACTICE SESSIONS

SPECIAL SESSIONS

DOCTORAL STUDENT CONTEST

EMBEDDED TUTORIALS

FEATURED PANELS

Registration

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Registration now open!! Avail Early Reg. rates before April 3rd, 2015

Registration is available at:
Registration is available at: http://tttc-vts.org/public_html/new/2015/?page_id=269

Hotel Reservation

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Reservation now open!! Avail Early Reg. rates before March 27, 2015

Registration is available at: http://tttc-vts.org/public_html/new/2015/?page_id=263

Advance Program

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For draft of program click http://tttc-vts.org/public_html/new/2015/?page_id=190

Additional Information

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General Information
General Chair
C. THIBEAULT
Ecole de Technologie Superieure (Canada)
Email: claude.thibeault@etsmtl.ca

Program Information
L. ANGHEL
University of Grenoble-Alpes, TIMA Laboratory (FR)
Email: lorena.anghel@imag.fr

For more information, visit us on the web at: http://www.tttc-vts.org

The 33rd IEEE VLSI Test Symposium is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).